FSM Proble Microscope
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FSM Proble Microscope
This set probe microscope is suitable for checking the semiconductor field, also for NUV and NIR but visible , while sharp image and high transmittion rate.
This set probe microscope is suitable for checking the Wafer and semiconductor field and so on, also for NUV and NIR but visible , excellent wave like 355nm, 365nm, 532nm, 1064nm, while sharp image and high transmittion rate.